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Armin Schwartzman

Armin Schwartzman’s research encompasses theoretical and practical aspects of statistical signal and image analysis in a variety of scientific applications. These include spatio-temporal and high-dimensional data analysis, geometric statistics and smooth Gaussian random fields, with applications in biomedicine, the environment, neuroscience, genetics and cosmology.

Armin Schwartzman received his bachelor’s and master’s degrees in electrical engineering from the Technion – Israel Institute of Technology and the California Institute of Technology; and his PhD in Statistics from Stanford University. He was an R&D engineer at Rockwell Semiconductor and Biosense Webster, and has held faculty positions in Biostatistics at Harvard University and Statistics at North Carolina State University.